Interfacial properties of Fe/Cr multilayers in the current-perpendicular-to-plane geometry

被引:29
作者
Zambano, A
Eid, K
Loloee, R
Pratt, WP
Bass, J [1 ]
机构
[1] Michigan State Univ, Dept Phys & Astron, Ctr Sensor Mat, E Lansing, MI 48824 USA
[2] Michigan State Univ, Dept Phys & Astron, Ctr Fundamental Mat Res, E Lansing, MI 48824 USA
基金
美国国家科学基金会;
关键词
magnetoresistance-giant; magnetoresistance-multilayers; transport properties; thin films-multilayers;
D O I
10.1016/S0304-8853(02)00169-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Recent arguments that the Current-Perpendicular-to-Plane (CPP) Magnetoresistance of Fe/Cr multilayers is sensitive to interfacial roughness stimulated us to try to repeat the experiments on which the claims were made. While our CPP specific-resistances are comparable to those previously reported, their detailed behaviors are different. Our data are consistent with a simple two-current series-resistor model with a single enhanced interface resistance 2AR(Fe/Cr)* = 1.6+/-0.15 fOmegam(2), in reasonable agreement with recent calculations. However, our best estimate of the interfacial scattering anisotropy parameter, gamma(Fe/Cr) = -(0.7+/-0.15), is larger in magnitude than predicted by the same calculations. We discuss possible reasons for the differences between our results and previous data. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:51 / 55
页数:5
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