Sputtering of a polycyclic hydrocarbon molecule: TOF-SIMS experiments and molecular dynamic simulations

被引:5
作者
Solomko, V
Delcorte, A
Garrison, BJ
Bertrand, P
机构
[1] Univ Catholique Louvain, Unite PhysicoChim & Phys Mat, B-1348 Louvain, Belgium
[2] Penn State Univ, Dept Chem, Davey Lab 512, University Pk, PA 16802 USA
关键词
secondary ion spectrometry; molecular dynamics simulations; ion emission; sputtering;
D O I
10.1016/j.apsusc.2004.03.024
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This study focuses on the desorption and ionization processes of an aromatic molecule containing several phenyl rings, 1,2,3,4-tetraphenylnaphthalene (TPN), adsorbed on a Au. surface, via the comparison of experimental secondary ion mass spectrometry (SIMS) data and molecular dynamic (MD) simulations. The mass spectra and kinetic energy distribution (KED) measurements were obtained using both TOF-SIMS and MD simulation methods. For entire TPN molecules, a good agreement is observed between the calculated and experimental KEDs, except for high energies, where they start diverging. This difference is partly caused by the unimolecular dissociation of internally excited molecules over larger time intervals than those considered in the simulation. In turn, using an internal energy threshold to remove the most excited molecules from the calculated KEDs provides a better agreement with the experiment. The MD simulations also show that molecules surrounding the impact point of the projectile are sputtered with more kinetic energy and shorter emission times than molecules located farther away from it. The distinct emission mechanisms inducing these different energy spectra are identified by the analysis of the simulation results. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:48 / 53
页数:6
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