Microwave resonance and weak pinning in two-dimensional hole systems at high magnetic fields

被引:60
作者
Li, CC [1 ]
Yoon, J
Engel, LW
Shahar, D
Tsui, DC
Shayegan, M
机构
[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
[2] Florida State Univ, Natl High Magnet Field Lab, Tallahassee, FL 32306 USA
[3] Weizmann Inst Sci, Dept Condensed Matter Phys, IL-76100 Rehovot, Israel
来源
PHYSICAL REVIEW B | 2000年 / 61卷 / 16期
关键词
D O I
10.1103/PhysRevB.61.10905
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microwave frequency conductivity Re(sigma(xx)) of high quality two-dimensional hole systems (2DHS) in a large perpendicular magnetic field (B) is measured with the carrier density (n(s)) of the 2DHS controlled by a backgate bias. The high-B insulating phase of the 2DHS exhibits a microwave resonance that remains well defined, but shifts to higher peak frequency (f(pk)) as n(s) is reduced. In different regimes, f'(pk) vs n(s) can be fit to f(pk)proportional to n(s)(-1/2) or to f(pk)proportional to n(s)(-3/2). The data clearly indicate that both carrier-carrier interactions and disorder are indispensable in determining the dynamics of the insulator. The n(s) dependence of f(pk) is consistent with a weakly pinned Wigner crystal in which domain size increases with n(s), due to larger carrier-carrier interaction.
引用
收藏
页码:10905 / 10909
页数:5
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