High quality superconducting tunnel junctions on Nb and Ta single crystals for radiation detection

被引：5

作者：

Bruijn, MP ^{[1
]}

Kiewiet, FB ^{[1
]}

vandenBerg, ML ^{[1
]}

Luiten, OJ ^{[1
]}

deKorte, PAJ ^{[1
]}

Hamster, AW ^{[1
]}

Brons, CGS ^{[1
]}

Flokstra, J ^{[1
]}

机构：

[1] UNIV TWENTE,FAC APPL PHYS,NL-7500 AE ENSCHEDE,NETHERLANDS

来源：

APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 09期

关键词：

D O I：

10.1063/1.119865

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

High duality Nb/Al-based tunnel junctions, fabricated with a superconducting interface onto thick single crystal x-ray absorbers of Nb and Ta are discussed. Current-voltage characteristics, recorded at 0.5 K, show a subgap current which is still dominated by thermally excited quasiparticles. The quality parameter R-subgap/R-normal reaches a value of several million, which is unequalled for nonepitaxially sputtered tunnel junctions. The fabrication process and some development steps, such as preparation of ultrasmooth crystal surfaces are described. Observations of x-ray photons absorbed in Nb and Ta single crystals detected by the superconducting tunnel junctions ar also presented, (C) 1997 American Institute of Physics.

引用

页码：1252 / 1254

页数：3

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