Theoretical study of cubic polytype inclusions in 4H-SiC

被引:15
作者
Iwata, H [1 ]
Lindefelt, U
Öberg, S
Briddon, PR
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden
[2] ABB Corp Res, Dept G, SE-72178 Vasteras, Sweden
[3] Lulea Univ Technol, Dept Math, SE-97187 Lulea, Sweden
[4] Univ Newcastle Upon Tyne, Dept Phys, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
来源
SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS | 2002年 / 389-3卷
关键词
first-principles calculations; polytype inclusions; stacking faults;
D O I
10.4028/www.scientific.net/MSF.389-393.533
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
First-principles density-functional calculations of the band structure and wave functions around narrow X-like inclusions in 4H-SiC have been performed. X-like inclusions of various thicknesses, corresponding to two, three, and four stacking faults in neighbouring basal planes, have been investigated. The results for the number of bound states in the inclusion, their energies, and wave functions are well described by a simple one-dimensional quantum-well square potential. The quantum-well property of these inclusions suggests that X-like regions in 4H-SiC are efficient planar traps for conduction band electrons.
引用
收藏
页码:533 / 536
页数:4
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