Application of ion scattering techniques to characterize polymer surfaces and interfaces

被引:92
作者
Composto, RJ [1 ]
Walters, RM
Genzer, J
机构
[1] Univ Penn, Dept Mat Sci & Engn, Res Struct Matter Lab, Philadelphia, PA 19104 USA
[2] Univ Penn, Dept Chem Engn, Philadelphia, PA 19104 USA
[3] N Carolina State Univ, Dept Chem Engn, Raleigh, NC 27695 USA
基金
美国国家科学基金会;
关键词
ion scattering; polymer surface; polymer interface; elastic recoil detection; forward recoil spectrometry; depth profiling;
D O I
10.1016/S0927-796X(02)00009-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ion beam analysis techniques, particularly elastic recoil detection (ERD) also known as forward recoil spectrometry (Frcs) has proven to be a value tool to investigate polymer surfaces and interfaces. A review of ERD, related techniques and their impact on the field of polymer science is presented. The physics of the technique is described as well as the underlying principles of the interaction of ions with matter. Methods for optimization of ERD for polymer systems are also introduced, specifically techniques to improve the depth resolution and sensitivity. Details of the experimental setup and requirements are also laid out. After a discussion of ERD, strategies for the subsequent data analysis are described. The review ends with the breakthroughs in polymer science that ERD enabled in polymer diffusion, surfaces, interfaces, critical phenomena, and polymer modification. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:107 / 180
页数:74
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