Microstructure characterization of dislocation wall structure in aluminum using transmission electron Microscopy

被引:18
作者
Gan, J [1 ]
Vetrano, JS [1 ]
Khaleel, MA [1 ]
机构
[1] Pacific NW Natl Lab, Richland, WA 99352 USA
来源
JOURNAL OF ENGINEERING MATERIALS AND TECHNOLOGY-TRANSACTIONS OF THE ASME | 2002年 / 124卷 / 03期
关键词
D O I
10.1115/1.1479178
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
The configuration of dislocation wall structures and the interactions between dislocations and dislocation walls play, a significant role in the understanding of deformation processes in metals. Samples of single-crystal aluminum deformed by tensile-straining (15%) were analyzed using TEM. In tensile-deformed (15%) single crystal aluminum, a cell structure is well developed and dislocations in the cell boundaries consist of either one set of Burgers vector or two sets of Burgers vector. The three-dimensional image of cell wall structure, misorientation angle across the cell boundaries and the Burgers vectors of dislocations in the cell boundaries are characterized.
引用
收藏
页码:297 / 301
页数:5
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