Synchrotron X-ray diffraction of SiO2 to multimegabar pressures

alpha-Quartz was compressed al room temperature in a diamond-anvil cell without a medium to maximum pressures of 31 to 213 GPa and was studied by energy-dispersive synchrotron X-ray diffraction. Broad peaks observed in a previous high-pressure diffraction study of silica glass are evident in the present study of quartz compression, providing in situ confirmation of pressure-induced amorphization above 21 GPa. The 21-GPa crystalline-crystalline (quartz I-II) transformation previously observed on quasihydrostatic compression of quartz is found to also occur under the current nonhydrostatic conditions, al the identical pressure. With nonhydrostatic compression, however, new sharp diffraction lines are observed at this pressure. The measurements show the coexistence of at least one amorphous and two crystalline phases above 21 GPa and below 43 GPa. The two crystalline phases are identified as quartz II and a new, high-pressure silica phase. The high-pressure phases, both crystalline and amorphous, can be quenched to ambient conditions from a maximum pressure of 43 GPa. With compression above 43 GPa, the diffraction pattern from quartz II is lost and the second crystalline phase persists to above 200 GPa.