A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry

被引：10

作者：

Affandi, Nor Dalila Nor ^{[1
,2
]}

Truong, Yen Bach ^{[1
]}

Kyratzis, Ilias Louis ^{[1
]}

Padhye, Rajiv ^{[2
]}

Arnold, Lyndon ^{[2
]}

机构：

[1] CSIRO, Div Mat Sci & Engn, Clayton, Vic 3169, Australia

[2] RMIT Univ, Sch Fash & Text, Brunswick, Vic 3056, Australia

来源：

JOURNAL OF MATERIALS SCIENCE | 2010年 / 45卷 / 05期

关键词：

NANOFIBROUS FILTERING MEDIA; INTERFEROMETRY; PREFILTERS; CELLS;

D O I：

10.1007/s10853-009-4103-6

中图分类号：

T [工业技术];

学科分类号：

120111 [工业工程];

摘要：

A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry has been reported. Such membranes are fabricated by spinning fibres in the presence of an electric field, known as electrospinning. Membrane thickness is one of the crucial properties for electrospun membrane. A white light profilometry would be an ideal instrument to determine material thickness particularly for porous and fibrous material. The step height measurement has been recognized as a method to measure the thickness of thin film. Two polymers were selected for the study, polyacrylonitrile (PAN) and Nylon 6. The PAN solution was prepared at 10% concentration w/w by dissolving the PAN. The use of white light to scan the sample will not damage the sample. This study has shown that white light profilometry can successfully employed to measure the thickness of thin electrospun membranes onto glass slide.

引用

页码：1411 / 1418

页数：8

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