Determination of sign of surface charges of ferroelectric TGS using electrostatic force microscope combined with the voltage modulation technique

被引:38
作者
Ohgami, J
Sugawara, Y
Morita, S
Nakamura, E
Ozaki, T
机构
[1] HIROSHIMA UNIV,FAC SCI,LAB CRYSTAL PHYS,HIGASHIHIROSHIMA 739,JAPAN
[2] HIROSHIMA UNIV,FAC SCI,DEPT MAT SCI,HIGASHIHIROSHIMA 739,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 5A期
关键词
surface charge; ferroelectrics; domain wall; TGS; EFM; surface topography; AFM;
D O I
10.1143/JJAP.35.2734
中图分类号
O59 [应用物理学];
学科分类号
摘要
The sign of surface charges and the surface topography around a domain wall on a cleaved (010) surface of ferroelectric TGS [(NH2CH2COOH)(3) . H2SO4] were studied in air at room temperature. Using an electrostatic force microscope (EFM) combined Evil;hl;he voltage modulation technique, we determined the location of the domain wall and the sign of the surface charges around ii. At tile domain wall, ire found a ridge structure with a large peak in the spatial distribution of a feedback signal used to keep the amplitude of the 2 omega component of electric force constant. This means that the dielectric constant has a large peak valve at the domain wall. Furthermore, in an atomic force microscope (AFM) image in a contact mode, nle observed a small step 2-3 Angstrom high at the center of the domain wall.
引用
收藏
页码:2734 / 2739
页数:6
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