Soft X-ray absorption, UV photoemission, and VUV absorption spectroscopic studies of fluorinated fullerenes

被引：19

作者：

Mitsumoto, R

Seki, K

Araki, T

Ito, E

Ouchi, Y

Achiba, Y

Kikuchi, K

Yajima, S

Kawasaki, S

Okino, F

Touhara, H

Kukrosaki, H

Sonoda, T

Kobayashi, H

机构：

[1] TOKYO METROPOLITAN UNIV,FAC SCI,DEPT CHEM,HACHIOJI,TOKYO 19203,JAPAN

[2] SHINSHU UNIV,FAC TEXT SCI & TECHNOL,DEPT CHEM,UEDA,NAGANO 386,JAPAN

[3] KYUSHU UNIV,INST ADV MAT STUDY,KASUGA,FUKUOKA 816,JAPAN

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1996年 / 78卷

关键词：

D O I：

10.1016/S0368-2048(96)80121-6

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

In this paper, chemical bonding and electronic structures of fluorinated fullerenes: C60Fx and C70Fx have been investigated by near edge X-ray absorption fine structure (NEXAFS) spectroscopy(1) and UV photoemission spectroscopy (UPS), which are useful methods for examining unoccupied and occupied states, respectively. With these results, we could derive an energy diagram for C60Fx. Electronic absorption spectroscopy of C60Fx solution was also measured and compared with theoretical simulations.

引用

页码：453 / 456

页数：4

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