OPMISR: The foundation for compressed ATPG vectors

被引：227

作者：

Barnhart, C ^{[1
]}

Brunkhorst, V ^{[1
]}

Distler, F ^{[1
]}

Farnsworth, O ^{[1
]}

Keller, B ^{[1
]}

Koenemann, B ^{[1
]}

机构：

[1] IBM Microelectron, Tucson, AZ USA

来源：

INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/TEST.2001.966696

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 [计算机科学与技术];

摘要：

Rapid increases in the wire-able gate counts of ASICs stresses existing manufacturing test equipment in terms of test data volume and test capacity Techniques are presented in this paper that allow for substantial compression of Automatic Test Pattern Generation (ATPG) produced test vectors. We show compression efficiencies allowing a more than 10-fold reduction in tester scan buffer data volume on ATPG compacted tests. In addition, we obtain almost a 2x scan test time reduction. By implementing these techniques for production testing of huge-gate-count ASICs, IBM will continue using existing automated test equipment (ATE) - avoiding costly upgrades and replacements.

引用

页码：748 / 757

页数：10

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