Organic molecular-beam deposition of perylene on Cu(110):: Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy

被引：38

作者：

Hänel, K ^{[1
]}

Söhnchen, S ^{[1
]}

Lukas, S ^{[1
]}

Beernink, G ^{[1
]}

Birkner, A ^{[1
]}

Strunskus, T ^{[1
]}

Witte, G ^{[1
]}

Wöll, C ^{[1
]}

机构：

[1] Ruhr Univ Bochum, D-44780 Bochum, Germany

来源：

JOURNAL OF MATERIALS RESEARCH | 2004年 / 19卷 / 07期

关键词：

D O I：

10.1557/JMR.2004.0256

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The growth of the polycyclic aromatic hydrocarbon perylene on (110) oriented copper substrates has been studied by means of x-ray photoelectron spectroscopy, near-edge x-ray absorption spectroscopy, and atomic force microscopy. In the monolayer regime, the molecules are orientated with their molecular plane parallel to the substrate, whereas they adopt a tilted arrangement in multilayer films. For multilayers with thicknesses exceeding 10 nm, the molecules grow in a bulk-like structure with their long axes orientated upright to the substrate surface.

引用

页码：2049 / 2056

页数：8

共 27 条

[1]

[Anonymous], NIST STAND REF DAT 7

[2] Epitaxial growth of a crystalline organic semiconductor: Perylene/Cu{110} [J].