Synthesis and characterization of polymer brushes on micromechanical cantilevers

被引:70
作者
Bumbu, GG [1 ]
Kircher, G [1 ]
Wolkenhauer, M [1 ]
Berger, R [1 ]
Gutmann, JS [1 ]
机构
[1] Max Planck Inst Polymer Res, D-55128 Mainz, Germany
关键词
atomic force microscopy (AFM); atom transfer radical polymerization (ATRP); microelectromechanical system (MEMS); polymer brushes; sensors;
D O I
10.1002/macp.200400195
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
A technique to cover microelectromechanical systems (MEMS). such as micromechanical cantilever (MC) sensors, with a covalently bound brush layer has been developed. The polymer layer was grown using a "grafting-from" synthesis of polymer brushes under mild conditions, by surface-initiated atom transfer radical polymerization. Atomic force microscopy (AFM) and ellipsometry have revealed a uniform thickness of about 12 nm from which a grafting density of polymer brushes of 0.19 chains.nm(-2) was estimated. The coating with polymer brushes can be realized on a selected surface. It was shown that a single-sided brush layer swells reversibly in toluene, resulting in a bending of the micromechanical cantilever.
引用
收藏
页码:1713 / 1720
页数:8
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