Strontium barium bismuth tantalate layered perovskites: thin film preparation and ferroelectric characteristics

被引:12
作者
Lu, CH [1 ]
Wen, CY [1 ]
机构
[1] Natl Taiwan Univ, Dept Chem Engn, Taipei 106, Taiwan
关键词
ferroelectric properties; films; microstructure-final; perovskites; tantalates; (Sr; Ba); Bi2Ta2O9;
D O I
10.1016/S0955-2219(99)00195-8
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The preparation processes and ferroelectric characteristics of barium cation-incorporated SrBi2Ta2O9 thin films have been investigated in this study. Complete solid solutions of (Sr1-xBax)Bi2Ta2O9 thin films are formed on Pt/Ti/SiO2/Si substrates using a metalorganic decomposition method after annealing at 700 degrees C. The lattice constant along the c-axis of formed solid solutions monotonously increases with increasing the contents of barium cations. The microstructure and surface morphologies of films significantly vary with the composition. The grain size and the roughness of (Sr1-xBax)Bi2Ta2O9 films increases as the contents of barium cations increase. All prepared films exhibit ferroelectric characteristics. Increasing the annealing temperature is found to significantly enhance the remanent polarization of prepared thin films. In the formed solid solutions, (Sr0.5Ba0.5)Bi2Ta2O9 thin films exhibit the highest remanent polarization. This is attributed to large grain size and preferred a-axis orientation of formed films. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:739 / 745
页数:7
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