Toward perfect antireflection coatings: numerical investigation

被引:247
作者
Dobrowolski, JA [1 ]
Poitras, D
Ma, P
Vakil, H
Acree, M
机构
[1] Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada
[2] GE Co, Corp Res & Dev, Niskayuna, NY 12309 USA
[3] Lockheed Martin Co, Palmdale, CA 93599 USA
关键词
D O I
10.1364/AO.41.003075
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A perfect antireflection (AR) coating would remove completely the reflection from an interface between two media for all wavelengths, polarizations, and angles of incidence. The degree to which this can be achieved is investigated numerically. It is shown that wideband solutions can be found provided that layers can be deposited with refractive indices that are close to that of the low-index medium. Thus realistic solutions exist for interfaces between two solid media. Narrow-band high-angle AR solutions are also possible for polarized light and for unpolarized light in the vicinity of certain reststrahlen bands. (C) 2002 Optical Society of America.
引用
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页码:3075 / 3083
页数:9
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