Error analysis of XAFS measurements

被引:20
作者
Krappe, HJ [1 ]
Rossner, HH [1 ]
机构
[1] Hahn Meitner Inst Kernforsch Berlin GmbH, D-14109 Berlin, Germany
关键词
D O I
10.1103/PhysRevB.61.6596
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We propose a method to analyze x-ray-absorption fine-structure data that avoids an arbitrary restriction of the size of the model-parameter space. It starts with an a priori guess of the model parameters which is introduced into the fitting procedure by Bayesian arguments. Two different descriptions are discussed to determine the relative impact of the a priori and experimental information on the fit. The resulting algorithms are tested by application to three simulated experiments at the Ta L-3-edge and to Cu K-edge data.
引用
收藏
页码:6596 / 6610
页数:15
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