Outage probability for optimum combining of arbitrarily faded signals in the presence of correlated Rayleigh interferers

被引:31
作者
Zhang, QT [1 ]
Cui, XW
机构
[1] City Univ Hong Kong, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China
[2] Tsinghua Univ, Dept Elect Engn, Beijing 100084, Peoples R China
关键词
correlated Nakagami fading; correlated Rayleigh fading; correlated Rician fading; optimum combining; outage probability;
D O I
10.1109/TVT.2004.830953
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 [电气工程]; 0809 [电子科学与技术];
摘要
Exact outage-probability analysis for optimum combining of arbitrarily faded signals in the presence of correlated Rayleigh-faded interferers is not available in the literature. In this paper, we show that the conditional probability density of the reciprocal of the instantaneous signal-to-interference ratio (SIR), given the signal vector, can be represented as the higher order derivative of a simple exponential function in signal power whereby generic formulas for the outage probability and probability density function related to SIR can be determined. The new formulas take simple closed form in terms of the characteristic function of the signal vector. They are, therefore, widely applicable, leading to various results for correlated Rayleigh-, Rician-, and Nakagami-faded signals. Numerical examples are also presented for illustration.
引用
收藏
页码:1043 / 1051
页数:9
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