The structure of titanium silicate glasses investigated by Si K-edge X-ray absorption spectroscopy

The structure of glasses along the TjO(2)-SiO2 join, have been investigated using Si K-edge extended X-ray absorption fine structure spectroscopy (EXAFS) and W-ray absorption near-edge spectroscopy (XANES). XANES spectra of glasses along the TiO2-SiO2 join indicate that the Si environment is similar in all glasses. The addition of TiO2 has little affect on the SiO2 network and there is Ilo significant distortion of the SiO, tetrahedron nor change in Si-O-Si bond angle. The calculated Si-O bond distance remains at about 1.60 even up to 11.6 mol% (14.9 wt%) TiO2: well within the metastable glass region. No evidence is observed fur the formation of Ti clusters.