Effects of ECRH power and safety factor on laser blow-off injected impurity confinement in TCV

被引:25
作者
Scavino, E [1 ]
Bakos, J
Weisen, H
机构
[1] Ecole Polytech Fed Lausanne, Assoc Euratom Confederat Suisse, Ctr Rech Phys Plasmas, CH-1015 Lausanne, Switzerland
[2] KFKI, Res Inst Particle & Nucl Phys, H-1525 Budapest, Hungary
关键词
D O I
10.1088/0741-3335/46/5/008
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Evidence from injection into the TCV device of laser ablated, non-recycling silicon impurities shows that the transport of impurities confinement can be remarkably different from that of energy. The ratio of impurity to energy confinement times ranges from near unity in Ohmic discharges to 5 in the presence of high power ECCD. In Ohmic discharges in deuterium, above a threshold of density and of safety factor near q(95) = 4.5, the impurity confinement time increases abruptly by a factor of 2 and is sometimes accompanied by indefinite retention of non-recycling impurities within the sawtooth mixing radius.
引用
收藏
页码:857 / 868
页数:12
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