Thickness dependence of surface plasmon polariton dispersion in transparent conducting oxide films at 1.55 μm

被引：103

作者：

Michelotti, F. ^{[1
,2
]}

Dominici, L. ^{[3
,4
]}

Descrovi, E. ^{[5
,6
]}

Danz, N. ^{[7
]}

Menchini, F. ^{[8
]}

机构：

[1] CNISM, Dipartimento Energet, Lab Foton Mol, I-00161 Rome, Italy

[2] SAPIENZA Univ Rome, I-00161 Rome, Italy

[3] TOR VERGATA Univ Rome, Dipartimento Ingn Elettron, I-00133 Rome, Italy

[4] TOR VERGATA Univ Rome, Ctr Hybrid & Organ Solar Energy, I-00133 Rome, Italy

[5] Politecn Torino, Dipartimento Fis, CNISM, I-10129 Turin, Italy

[6] Politecn Torino, Dipartimento Fis, Lab Mat & Microsistemi, XLab, I-10129 Turin, Italy

[7] Fraunhofer Inst Angew Opt & Feinmechan, D-07745 Jena, Germany

[8] Energia & Ambiente CR Casaccia, I-00123 S Maria In Galeria, Italy

来源：

OPTICS LETTERS | 2009年 / 34卷 / 06期

关键词：

D O I：

10.1364/OL.34.000839

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We experimentally demonstrate propagation of surface plasmon polaritons in the near-IR window lambda is an element of (1.45 mu m, 1.59 mu m) at the interface of indium-tin-oxide films with different thicknesses deposited on glass. Dispersion of such polaritons is strongly dependent on the film thickness, putting into evidence a regime in which polaritons; at both films's interfaces are coupled in surface supermodes. The experimental data are shown to be in good agreement with the analytical model for thin and absorbing conducting films. Measurements on aluminum-doped zinc oxide, characterized by a redshifted plasma resonance, do not show any surface plasmon polariton excitation in the same wavelength window. (C) 2009 Optical Society of America.

引用

页码：839 / 841

页数：3

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