Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy

被引：322

作者：

Carpick, RW

Ogletree, DF

Salmeron, M

机构：

[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720

[2] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720

来源：

APPLIED PHYSICS LETTERS | 1997年 / 70卷 / 12期

关键词：

ATOMIC-SCALE FRICTION; CAPILLARY CONDENSATION; CONTACT; SURFACE; FILMS;

D O I：

10.1063/1.118639

中图分类号：

O59 [应用物理学];

学科分类号：

070305 [高分子化学与物理];

摘要：

We present a technique to measure the lateral stiffness of the nanometer-sized contact formed between a friction force microscope tip and a sample surface. Since the lateral stiffness of an elastic contact is proportional to the contact radius, this measurement can be used to study the relationship between friction, load, and contact area. As an example, we measure the lateral stiffness of the contact between a silicon nitride tip and muscovite mica in a humid atmosphere (55% relative humidity) as a function of load. Comparison with friction measurements confirms that friction is proportional to contact area and allows determination of the shear strength. (C) 1997 American Institute of Physics.

引用

页码：1548 / 1550

页数：3

共 29 条

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