Transient x-ray diffraction and its application to materials science and x-ray optics

被引:5
作者
Hauer, AA
Wark, JS
Kalantar, D
Remington, B
Kopp, R
Cobble, J
Failor, B
Kyrala, G
Meyers, M
Springer, R
Boehley, T
机构
来源
APPLICATIONS OF X RAYS GENERATED FROM LASERS AND OTHER BRIGHT SOURCES | 1997年 / 3157卷
关键词
D O I
10.1117/12.283986
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Time resolved x-ray diffraction and scattering have been applied to the measurement of a wide variety of physical phenomena from chemical reactions to shock wave physics. Interest in this method has heightened in recent years with the advent of versatile, high power, pulsed x-ray sources utilizing laser plasmas, electron beams and other methods. In this article, we will describe some of the fundamentals involved in time resolved x-ray diffraction, review some of the history of its development, and describe some recent progress in the field. In this article we will emphasize the use of laser-plasmas as the x-ray source for transient diffraction.
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页码:72 / 83
页数:12
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