Simple amplitude and phase measuring technique for ultrahigh-repetition-rate lasers

被引:19
作者
Kockaert, P
Peeters, M
Coen, S
Emplit, P
Haelterman, M
Deparis, O
机构
[1] Free Univ Brussels, B-1050 Brussels, Belgium
[2] Fac Polytech Mons, Chaire Electromagnetisme & Telecommun, B-7000 Mons, Belgium
关键词
gratings; laser measurements; optical pulse measurements; pulsed lasers;
D O I
10.1109/68.823512
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A simple method for the full amplitude and phase characterization of the light emitted by continuous-wave ultrahigh-repetition-rate lasers is experimentally demonstrated. The method is based on the measurement of the beat notes obtained by filtering pairs of adjacent longitudinal laser modes in a high-resolution, zero-dispersion grating-lens spectroscope arrangement. The method only requires the use of a simple fast photodiode and does not involve any nonlinear optical process.
引用
收藏
页码:187 / 189
页数:3
相关论文
共 6 条
[1]   DIRECT MEASUREMENT OF THE SPECTRAL PHASE OF FEMTOSECOND PULSES [J].
CHU, KC ;
HERITAGE, JP ;
GRANT, RS ;
LIU, KX ;
DIENES, A ;
WHITE, WE ;
SULLIVAN, A .
OPTICS LETTERS, 1995, 20 (08) :904-906
[2]   Simple method for the complete characterization of an optical pulse [J].
Debeau, J ;
Kowalski, B ;
Boittin, R .
OPTICS LETTERS, 1998, 23 (22) :1784-1786
[3]   Spectral phase interferometry for direct electric-field reconstruction of ultrashort optical pulses [J].
Iaconis, C ;
Walmsley, IA .
OPTICS LETTERS, 1998, 23 (10) :792-794
[4]   Complete characterization of femtosecond pulses using an all-electronic detector [J].
Prein, S ;
Diddams, S ;
Diels, JC .
OPTICS COMMUNICATIONS, 1996, 123 (4-6) :567-573
[5]   Measuring ultrashort laser pulses in the time-frequency domain using frequency-resolved optical gating [J].
Trebino, R ;
DeLong, KW ;
Fittinghoff, DN ;
Sweetser, JN ;
Krumbugel, MA ;
Richman, BA ;
Kane, DJ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (09) :3277-3295
[6]   ANALYSIS OF ULTRASHORT PULSE-SHAPE MEASUREMENT USING LINEAR INTERFEROMETERS [J].
WONG, V ;
WALMSLEY, IA .
OPTICS LETTERS, 1994, 19 (04) :287-289