XAFS spectroscopy; fundamental principles and data analysis

被引：450

作者：

Koningsberger, DC

Mojet, BL

van Dorssen, GE

Ramaker, DE

机构：

[1] Univ Utrecht, Debye Inst, Dept Inorgan Chem & Catalysis, NL-3508 TB Utrecht, Netherlands

[2] George Washington Univ, Dept Chem, Washington, DC 20052 USA

[3] George Washington Univ, Inst Mat Sci, Washington, DC 20052 USA

来源：

TOPICS IN CATALYSIS | 2000年 / 10卷 / 3-4期

关键词：

XAFS physical principles; XAFS data analysis; fitting in R-space; detection of low Z scatterers; phase- and amplitude-corrected Fourier transforms; difference file technique; use of theoretical references;

D O I：

10.1023/A:1019105310221

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

The physical principles of XAFS spectroscopy are given at a sufficiently basic level to enable scientists working in the field of catalysis to critically evaluate articles dealing with XAFS studies on catalytic materials. The described data-analysis methods provide the basic tools for studying the electronic and structural properties of supported metal, metal-oxide or metal-sulfide catalysts. These methods include (a) fitting in R-space, (b) application of the difference file technique and (c) control of the fit procedure with k(1) and k(3) weighting with the help of phase- and amplitude-corrected Fourier transforms.

引用

页码：143 / 155

页数：13

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