On the characterization of optical fiber network components with optical frequency domain reflectometry

被引:118
作者
vonderWeid, JP [1 ]
Passy, R [1 ]
Mussi, G [1 ]
Gisin, N [1 ]
机构
[1] UNIV GENEVA,APPL PHYS GRP,CH-1211 GENEVA 4,SWITZERLAND
关键词
frequency domain analysis; optical fibers; optical interferometry; optical fiber measurement applications; optical fiber measurement; optical reflection;
D O I
10.1109/50.596958
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The basic features of coherent optical frequency domain reflectometry are presented, The ultimate limits of range and sensitivity were discussed, as well as polarization effects, It is shown that this technique is very suitable for optical network components characterization, and accurate measurements of a number of such components are presented.
引用
收藏
页码:1131 / 1141
页数:11
相关论文
共 23 条
[1]   OPTICAL LOW-COHERENCE REFLECTOMETRY WITH RANGE EXTENSION GREATER-THAN-150M [J].
BANEY, DM ;
SORIN, WV .
ELECTRONICS LETTERS, 1995, 31 (20) :1775-1776
[2]   OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY IN SINGLE-MODE FIBER [J].
EICKHOFF, W ;
ULRICH, R .
APPLIED PHYSICS LETTERS, 1981, 39 (09) :693-695
[3]   SUBMILLIMETER OPTICAL REFLECTOMETRY [J].
GILGEN, HH ;
NOVAK, RP ;
SALATHE, RP ;
HODEL, W ;
BEAUD, P .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1989, 7 (08) :1225-1233
[4]   COHERENT FREQUENCY-DOMAIN REFLECTOMETRY FOR CHARACTERIZATION OF SINGLE-MODE INTEGRATED-OPTICAL WAVE-GUIDES [J].
GLOMBITZA, U ;
BRINKMEYER, E .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1993, 11 (08) :1377-1384
[5]  
HARRIS FJ, 1978, P IEEE, V66, P51, DOI 10.1109/PROC.1978.10837
[6]   FADING IN HETERODYNE OTDR [J].
HEALEY, P .
ELECTRONICS LETTERS, 1984, 20 (01) :30-32
[7]   FADING NOISE-REDUCTION IN COHERENT OTDR [J].
IZUMITA, H ;
FURUKAWA, S ;
KOYAMADA, Y ;
SANKAWA, I .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1992, 4 (02) :201-203
[8]  
MIYAMOTO K, 1994, LASER FOCUS WORLD, V30, P81
[9]   -152.5 dB sensitivity high dynamic-range optical frequency-domain reflectometry [J].
Mussi, G ;
Gisin, N ;
Passy, R ;
vonderWeid, JP .
ELECTRONICS LETTERS, 1996, 32 (10) :926-927
[10]   Polarization effects in coherent optical frequency-domain reflectometry [J].
Mussi, G ;
Stamp, P ;
Gisin, N ;
Passy, R ;
vonderWeid, JP .
IEEE PHOTONICS TECHNOLOGY LETTERS, 1996, 8 (11) :1513-1515