Statistical analysis of near-field photoluminescence spectra of single ultrathin layers of CdSe/ZnSe

被引:27
作者
von Freymann, G [1 ]
Kurtz, E [1 ]
Klingshirn, C [1 ]
Wegener, M [1 ]
机构
[1] Univ Karlsruhe TH, Inst Angew Phys, D-76128 Karlsruhe, Germany
关键词
D O I
10.1063/1.126987
中图分类号
O59 [应用物理学];
学科分类号
摘要
The statistical analysis of thousands of near-field photoluminescence spectra of single ultrathin CdSe layers at 20 K exhibits a strong positive correlation peak around 20 meV energy with a width of 5 meV. Our data are consistent with individual spectra which consist of sets of many pairs of lines. In each pair, the two lines must have comparable strength. We speculate about the origin of these pairs. (C) 2000 American Institute of Physics. [S0003-6951(00)03229-0].
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收藏
页码:394 / 396
页数:3
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