In-situ, non-destructive identification of chemical elements by means of portable EDXRF spectrometer

The performances of a new portable EDXRF (Energy Dispersive X-ray Fluorescence) Spectrometer designed for insitu, non-destructive identification of chemical elements in materials are here described. The instrument, based on a Silicon Drift Detector cooled by a Peltier element, does not require a liquid nitrogen cooling system. The energy resolution of the spectrometer is typically 155 eV FWHM at 6 keV at a temperature of about -8 degrees C and the peak to valley ratio is better than 10000. The paper reports on the most significant results recently obtained, by using a new version of the Silicon Drift Detector, in measurements carried out "on-the-field" on samples of different materials. The results of the first quantitative analyses of metal alloys carried out with this instrument are also presented.