Grain-size effect on pressure-induced semiconductor-to-metal transition in ZnS

被引:73
作者
Jiang, JZ
Gerward, L
Frost, D
Secco, R
Peyronneau, J
Olsen, JS
机构
[1] Tech Univ Denmark, Dept Phys, DK-2800 Lyngby, Denmark
[2] Univ Bayreuth, Bayer Geoinst, D-95440 Bayreuth, Germany
[3] Inst Phys Globe, Lab Geomat, F-75252 Paris, France
[4] Niels Bohr Inst, Oersted Lab, DK-2100 Copenhagen, Denmark
关键词
D O I
10.1063/1.371631
中图分类号
O59 [应用物理学];
学科分类号
摘要
The grain-size effect on the semiconductor-to-metal transition in ZnS has been investigated by in situ high-pressure electrical resistance and optical measurements. It is found that the grain-size effect can elevate the transition pressure of ZnS in a larger pressure range. On the basis of the results obtained and results reported in the literature, we demonstrate that the dangers of using the transition pressures of the II-VI compounds as pressure calibrators without a detailed knowledge of their grain-size effects on the transition pressures cannot be overstressed. (C) 1999 American Institute of Physics. [S0021-8979(99)03922-5].
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页码:6608 / 6610
页数:3
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