High Electron Mobility of Amorphous Red Phosphorus Thin Films

被引:41
作者
Amaral, Pedro E. M. [1 ]
Nieman, Glen P. [1 ]
Schwenk, Gregory R. [1 ]
Jing, Hao [1 ]
Zhang, Raymond [1 ]
Cerkez, Elizabeth B. [2 ]
Strongin, Daniel [2 ]
Ji, Hai-Feng [1 ]
机构
[1] Drexel Univ, Dept Chem, Philadelphia, PA 19104 USA
[2] Temple Univ, Dept Chem, Philadelphia, PA 19122 USA
关键词
air stability; field-effect transistor; red phosphorus; semiconductor; thin film; HIGH-PERFORMANCE ANODE; BLACK PHOSPHORUS; CRYSTAL-STRUCTURE; WHITE PHOSPHORUS; PHOTOCATALYST; SEMICONDUCTOR; TRANSISTORS; COMPOSITE;
D O I
10.1002/anie.201902534
中图分类号
O6 [化学];
学科分类号
070301 [无机化学];
摘要
Black phosphorus (BP) has been gathering great attention for its electronic and optoelectronic applications due to its high electron mobility and high I-ON/OFF current switching ratio. The limitations of this material include its low synthetic yield and high cost. One alternative to BP is another type of phosphorus allotrope, red phosphorus (RP), which is much more affordable and easier to process. Although RP has been widely used in industry for hundreds of years and considered as an insulating material, in this study, we demonstrate through field-effect transistors (FET) measurements that amorphous red phosphorus (alpha-RP) films are semiconductive with a high mobility of 387cm(2)V(-1)s(-1) and a current switching ratio of approximate to 10(3), which is comparable to the electronic characteristics previously reported for BP. The films were produced via a thermal evaporation method or a facile drop-casting approach onto Si/SiO2 substrates. We also report a study of the oxidation process of the films over time and a method to stabilize the films via doping a-RP with metal oxides. The doped films retain stability for one thousand I-V cycles, with no signs of degradation.
引用
收藏
页码:6766 / 6771
页数:6
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