Ion-Ion Correlation and Charge Reversal at Titrating Solid Interfaces

被引:81
作者
Labbez, Christophe [1 ]
Jonsson, Bo [2 ]
Skarba, Michal [3 ]
Borkovec, Michal [3 ]
机构
[1] Univ Bourgogne, Inst Carnot Bourgogne, CNRS, UNR 5209, F-21078 Dijon, France
[2] Lund Univ, Ctr Chem, Dept Theoret Chem, S-22100 Lund, Sweden
[3] Univ Geneva, Dept Inorgan Analyt & Appl Chem, CH-1211 Geneva 4, Switzerland
关键词
ELECTRICAL DOUBLE-LAYER; SURFACE-CHARGE; SILICA; INVERSION; DENSITY; MODELS;
D O I
10.1021/la900853e
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Confronting grand canonical titration Monte Carlo simulations (MC) with recently published titration and charge reversal (CR) experiments on silica surfaces by Dove and Craven (Dove, P. M.; Craven, C. M. Geochim. Cosmochim. Acta 2005, 69, 4963-4970) and van der Heyden et al. (van der Heyden, F. H. J.; Stein, D.; Besteman, K.; Lemay, S. G.; Dekker, C. Phys. Rev. Lett. 2006, 96, 224502), we show that ion-ion correlations quantitatively explain why divalent counterions strongly promote surface charge which, in turn, eventually causes a CR. Titration and CR results from simulations and experiments are in excellent agreement without any fitting parameters. This is the first unambiguous evidence that ion-ion correlations arc instrumental in the creation of highly charged surfaces and responsible for their CR. Finally, we show that charge correlations result in "anomalous" charge regulation in strongly coupled conditions in qualitative disagreement with its classical treatment.
引用
收藏
页码:7209 / 7213
页数:5
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