Orbital debris as detected on exposed spacecraft

被引:18
作者
Bernhard, RP [1 ]
Christiansen, EL [1 ]
Kessler, DE [1 ]
机构
[1] NASA,EARTH SCI & SOLAR SYST EXPLORAT DIV,LYNDON B JOHNSON SPACE CTR,HOUSTON,TX 77058
关键词
D O I
10.1016/S0734-743X(97)87485-4
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Spacecraft surfaces returned to the laboratory after being exposed to the low Earth orbit (LEO) environment have been examined by Scanning Electron Microscopy and Energy Dispersive X-ray (SEM/EDX) over the last two decades. Although many of these surfaces were not intended to be used as hypervelocity impact capture medium, meteoroid and orbital debris particles colliding with exposed surfaces are well documented. This paper will address the more predominant impact damage caused by orbital debris on the spacecraft hardware analyzed at the Johnson Space Center over the last decade.
引用
收藏
页码:111 / 120
页数:10
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