Identification of the misfit dislocations at YBa2Cu3O7-δ/SrTiO3 interface using moire fringe contrast

被引:25
作者
Wang, H. [1 ]
Foltyn, S. R.
Arendt, P. N.
Jia, Q. X.
Zhang, X.
机构
[1] Texas A&M Univ, Dept Elect & Comp Engn, College Stn, TX 77843 USA
[2] Los Alamos Natl Lab, Superconduct Technol Ctr, Los Alamos, NM 87545 USA
[3] Texas A&M Univ, Dept Mech Engn, College Stn, TX 77843 USA
来源
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 2006年 / 444卷 / 1-2期
关键词
moire fringe; misfit dislocation; YBCO; TEM;
D O I
10.1016/j.physc.2006.05.078
中图分类号
O59 [应用物理学];
学科分类号
摘要
Misfit dislocations at YBa2Cu3O7-delta (YBCO)/SrTiO3 (STO) interfaces were studied to understand effects which could be responsible for the high interfacial J(c) in YBCO thin films. In YBCO films with thickness ranging from 5 to 100 nm, the interfacial structures (e.g. misfit dislocations) of YBCO/STO were investigated using moire fringe contrast in plan-view transmission electron microscopy (TEM). The observed moire pattern has a spacing of 17 nm which corresponds to the lattice mismatch between the YBCO a lattice spacing and the cubic STO lattice constant. As the YBCO thickness reaches 100 nm, twin structures dominate the image contrast. Our observations indicate that the moire pattern originates from the lattice mismatch between the substrate and the orthorhombic phase of YBCO. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 4
页数:4
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