Electroluminescence thermal quenching in SrS:Cu thin-film electroluminescent devices

被引:10
作者
Baukol, BA [1 ]
Hitt, JC [1 ]
Keir, PD [1 ]
Wager, JF [1 ]
机构
[1] Oregon State Univ, Ctr Adv Mat Res, Dept Elect & Comp Engn, Corvallis, OR 97331 USA
关键词
D O I
10.1063/1.125697
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electroluminesence (EL) thermal quenching refers a reduction in luminance, concomitant with a reduction in transferred charge, when an alternating-current thin-film electroluminescent (ACTFEL) device is operated at an elevated temperature. EL thermal quenching is found to be significant in SrS:Cu ACTFEL devices operated above similar to 60-80 degrees C. Maximum transferred charge-maximum applied voltage (Q(max)-V-max) and transferred charge capacitance (i.e., dQ(max)/dV(max) vs V-max) measurements as a function of temperature in conjunction with ACTFEL device simulation are employed in order to establish that EL thermal quenching arises from a thermally activated annihilation of positive space charge and a corresponding increase in the threshold voltage. (C) 2000 American Institute of Physics. [S0003-6951(00)02902-8].
引用
收藏
页码:185 / 187
页数:3
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