Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions

被引：67

作者：

Cho, Y ^{[1
]}

Atsumi, S ^{[1
]}

Nakamura, K ^{[1
]}

机构：

[1] TOHOKU UNIV,FAC ENGN,DEPT ELECT COMMUN,SENDAI,MIYAGI 98077,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 5B期

关键词：

scanning nonlinear dielectric microscope; lumped constant resonator probe;

D O I：

10.1143/JJAP.36.3152

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new probe using a lumped constant resonator for the scanning nonlinear dielectric microscope has been developed. This probe has sufficient resolution to observe the area distribution of ferroelectric polarization. Using this probe, the distributions of the domains in the thin film of a, copolymer of vinylidene fluoride and trifluoroethylene and in a lithium niobate substrate with a titanium-diffused inversion layer are observed.

引用

页码：3152 / 3156

页数：5

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