Self-organized criticality in the Bean state in YBa2Cu3O7-x thin films

被引：28

作者：

Aegerter, CM ^{[1
]}

Welling, MS ^{[1
]}

Wijngaarden, RJ ^{[1
]}

机构：

[1] Free Univ Amsterdam, Div Phys & Astron, NL-1081 HV Amsterdam, Netherlands

来源：

EUROPHYSICS LETTERS | 2004年 / 65卷 / 06期

关键词：

D O I：

10.1209/epl/i2003-10132-1

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The penetration of magnetic flux into a thin film of YBa2Cu3O7-x is studied when the external field is ramped slowly. In this case, the flux penetrates in bursts or avalanches. The size of these avalanches is distributed according to a power law with an exponent of T = 1.29(2). The additional observation of finite-size scaling of the avalanche distributions, with an avalanche dimension D = 1.89(3), gives strong indications towards self-organized criticality in this system. Furthermore, we determine exponents governing the roughening dynamics of the flux surface using some universal scaling relations. These exponents are compared to those obtained from a standard roughening analysis.

引用

页码：753 / 759

页数：7

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