Melting and joining behavior of Sn/Ag and Sn-Ag/Sn-Bi plating on Cu core ball

被引:27
作者
Uenishi, K
Kohara, Y
Sakatani, L
Saeki, T
Kobayashi, KF
Yamamoto, M
机构
[1] Osaka Univ, Grad Sch Engn, Dept Mfg Sci, Suita, Osaka 5650871, Japan
[2] Kagoshima Sumitoku Elect Co Ltd, Izumi 8990201, Japan
关键词
ball grid array; lead free solder; intermetallic compound; copper cored ball; reaction layer; shear strength;
D O I
10.2320/matertrans.43.1833
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We fabricated Cu core Sn-Ag solder balls by plating pure Sn and Ag on Cu balls and clarified that Sn/Ag plating began to melt at a rather low temperature, the eutectic temperature of Sn-Ag-Cu. This early melting at the eutectic temperature was ascribed to the diffusion of Cu and Ag into the Sn plating during the heating process. We investigated the solderability of the BGA joint with the Ni/Au coated Cu pad to compare it with that of the commercial Sn-Ag and Sn-Ag-Cu balls. After reflow soldering, we observed a eutectic microstructure composed of beta-Sn, Ag3Sn, and Cu6Sn5 phases in the solder, and a eta'-(Au, Cu, Ni)(6)Sn-5 reaction layer was formed at the interface between the solder and the Cu pad. The BGA joint using Cu core solder balls could prevent the degradation of joint strength during aging at 423 K because of the slower growth rate of the eta'-(Au, Cu, Ni)(6)Sn-5 reaction layer formed at the solder-pad interface. Furthermore, we were able to fabricate Cu-cored, multicomponent Sn-Ag-Bi balls by sequentially coating binary Sn-Ag and Sn-Bi solders onto Cu balls. The coated balls also exhibited almost the same melting and soldering behaviors as those of the previously alloyed Sn-2Ag-0.75Cu-3Bi solders.
引用
收藏
页码:1833 / 1839
页数:7
相关论文
共 22 条
[1]   Effect of PCB finish on the reliability and wettability of ball grid array packages [J].
Bradley, E ;
Banerji, K .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1996, 19 (02) :320-330
[2]  
HAIMOVICH J, 1989, WELD J, V68, pS102
[3]  
Haimovich J., 1990, P AESF ANN TECHN C, P689
[4]   Influence of interfacial reaction on reliability of QFP joints with Sn-Ag based Pb free solders [J].
Hirose, A ;
Fujii, T ;
Imamura, T ;
Kobayashi, KF .
MATERIALS TRANSACTIONS, 2001, 42 (05) :794-802
[5]  
ITO M, 2002, P 8 S MICR ASS TECHN, P231
[6]   Interfacial reactions during soldering with lead-tin eutectic and lead (Pb)-free, tin-rich solders [J].
Kang, SK ;
Rai, RS ;
Purushothaman, S .
JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (07) :1113-1120
[7]  
Kay P. J., 1979, Transactions of the Institute of Metal Finishing, V57, P169
[8]  
KIYONO S, 1999, P 5 S MICR ASS TECHN, P115
[9]  
KIYONO S, 1999, JPN J ELECT PACKAGIN, V2, P298
[10]  
KIYONO S, 2000, P 6 S MICR ASS TECHN, P125