Sampled-speckle photography for measurement of deformation

被引：14

作者：

Asundi, A ^{[1
]}

机构：

[1] Nanyang Technol Univ, Sensors & Actuators Programme, Sch Mech & Prod Univ, Singapore, Singapore

来源：

OPTICS LETTERS | 2000年 / 25卷 / 04期

关键词：

D O I：

10.1364/OL.25.000218

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Speckles usually are of two kinds: laser speckle and white-light speckle. An additional kind, termed a sampled speckle, is proposed. Whereas laser speckles arise fi om multiple interference of light scattered from an object illuminated by a coherent laser beam and white-light speckles are a physically generated speckle pattern on the surface of the object, sampled speckles are generated as a result of the sampling of a digital image. The generation of these speckles and their application to displacement measurement are demonstrated. (C) 2000 Optical Society of America OCIS codes: (C) 2000 Optical Society of America 030.6140, 110.6150, 100.2000.

引用

页码：218 / 220

页数：3

共 7 条

[1] THEORY AND APPLICATIONS OF THE WHITE-LIGHT SPECKLE METHOD FOR STRAIN ANALYSIS [J].

ASUNDI, A ;

CHIANG, FP .

OPTICAL ENGINEERING, 1982, 21 (04) :570-580

[2] PRODUCTION OF MULTIPLE BEAM FRINGES FROM PHOTOGRAPHIC SCATTERERS [J].

BURCH, JM ;

TOKARSKI, JM .

OPTICA ACTA, 1968, 15 (02) :101-&

[3] DIGITAL FILTERING OF SPECKLE-PHOTOGRAPHY DATA [J].

CHAMBLESS, DA ;

BROADWAY, JA .

EXPERIMENTAL MECHANICS, 1979, 19 (08) :286-289

[4] WHITE-LIGHT SPECKLE METHOD OF EXPERIMENTAL STRAIN ANALYSIS [J].

CHIANG, FP ;

ASUNDI, A .

APPLIED OPTICS, 1979, 18 (04) :409-411

[5] APPLICATIONS OF DIGITAL-IMAGE-CORRELATION TECHNIQUES TO EXPERIMENTAL MECHANICS [J].

CHU, TC ;

RANSON, WF ;

SUTTON, MA ;

PETERS, WH .

EXPERIMENTAL MECHANICS, 1985, 25 (03) :232-244

[6] STRAIN ANALYSIS BY ONE BEAM LASER SPECKLE INTERFEROMETRY .1. SINGLE APERTURE METHOD [J].

KHETAN, RP ;

CHIANG, FP .

APPLIED OPTICS, 1976, 15 (09) :2205-2215

[7]

Sirohi R S, 1993, SPECKLE METROLOGY

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