Thermal conductivity measurement of microgram whiskers

被引：9

作者：

Verebelyi, DT ^{[1
]}

机构：

[1] S CAROLINA STATE UNIV,DEPT PHYS SCI,ORANGEBURG,SC 29117

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1997年 / 68卷 / 06期

关键词：

D O I：

10.1063/1.1148147

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A method of measuring the thermal conductivity of 25 mu m wire and of single crystals with dimensions less than 1000 X 100 X 10 mu m(3) is described using the classic longitudinal steady-state method. Data from a Pb-doped Bi2Sr2Ca1Cu2Ox (Bi-2212) whisker is verified with Nb, Pt, and Au standards. Careful application of temperature matching shielding and microthermocouples have produced an absolute measurement with an error less than 25% over the temperature range 30-200 K. A complete accounting of significant errors is reported. (C) 1997 American Institute of Physics.

引用

页码：2494 / 2498

页数：5

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