Line broadening analysis using integral breadth methods: a critical review

被引:329
作者
Scardi, P
Leoni, M
Delhez, R
机构
[1] Univ Trent, Dept Mat Engn & Ind Technol, I-38050 Trento, Italy
[2] Dept Mat Sci & Engn, NL-2628 AL Delft, Netherlands
关键词
D O I
10.1107/S0021889804004583
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Integral breadth methods for line profile analysis are reviewed, including modifications of the Williamson - Hall method recently proposed for the specific case of dislocation strain broadening. Two cases of study, supported by the results of a TEM investigation, are considered in detail: nanocrystalline ceria crystallized from amorphous precursors and highly deformed nickel powder produced by extensive ball milling. A further application concerns a series of Fe - Mo powder specimens that were ball milled for increasing time. Traditional and modified Williamson - Hall methods confirm their merits for a rapid overview of the line broadening effects and possible understanding of the main causes. However, quantitative results are generally not reliable. Limits in the applicability of integral breadth methods and reliability of the results are discussed in detail.
引用
收藏
页码:381 / 390
页数:10
相关论文
共 69 条
[1]  
Armstrong N, 2004, DIFFRACTION ANALYSIS OF THE MICROSTRUCTURE OF MATERIALS, P187
[2]  
ARMSTRONG N, 2001, P 3 C ACC POWD DIFFR
[3]  
ARMSTRONG N, 2004, SPRINGER SERIES MAT, V68, P249
[4]  
Balasingh C., 1991, POWDER DIFFR, V6, P16, DOI [10.1017/S0885715600016791, DOI 10.1017/S0885715600016791]
[5]   PROFILE FITTING OF X-RAY-DIFFRACTION LINES AND FOURIER-ANALYSIS OF BROADENING [J].
BALZAR, D .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 :559-570
[6]  
Balzar D, 1996, J APPL CRYSTALLOGR, V29, P16, DOI 10.1107/S0021889895008478
[7]  
Balzar D., 1999, IUCR M CRYS, V10, P94
[8]   Electrodeposition of ZnO thin films on n-Si(100) [J].
Dalchiele, EA ;
Giorgi, P ;
Marotti, RE ;
Martín, F ;
Ramos-Barrado, JR ;
Ayouci, R ;
Leinen, D .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2001, 70 (03) :245-254
[9]   DETERMINATION OF CRYSTALLITE SIZE AND LATTICE-DISTORTIONS THROUGH X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS - RECIPES, METHODS AND COMMENTS [J].
DELHEZ, R ;
DEKEIJSER, TH ;
MITTEMEIJER, EJ .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01) :1-16
[10]   SIZE AND STRAIN PARAMETERS FROM PEAK PROFILES - SENSE AND NONSENSE [J].
DELHEZ, R ;
DEKEIJSER, TH ;
MITTEMEIJER, EJ ;
LANGFORD, JI .
AUSTRALIAN JOURNAL OF PHYSICS, 1988, 41 (02) :213-227