AFM/LFM surface studies of a ternary polymer blend cast on substrates covered by a self-assembled monolayer

被引：47

作者：

Cyganik, P ^{[1
]}

Budkowski, A ^{[1
]}

Raczkowska, J ^{[1
]}

Postawa, Z ^{[1
]}

机构：

[1] Jagiellonian Univ, Smoluchowski Inst Phys, PL-30059 Krakow, Poland

来源：

SURFACE SCIENCE | 2002年 / 507卷

关键词：

atomic force microscopy; friction; self-assembly; surface thermodynamics (including phase transitions); growth;

D O I：

10.1016/S0039-6028(02)01339-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Nanometer films composed of model ternary blend of deuterated polystyrene (dPS), poly(2-vinylpyridine) (PVP) and poly(methyl methacrylate) (PMMA) were studied after spin-coating from a common solvent. Surface undulations and the distribution of phase-separated domains Lit the Surface and in the bulk are closely related as revealed by atomic (AFM) and lateral (LFM) force microscopy. For the first time the chemical sensitivity of LEM is demonstrated for a ternary polymer mixture. In this case PMMA intercalates between dPS and PVP leading to extended interfaces and surface patterns with two dominant length scales (similar to1 mum and similar to100 nm). Both of these length scales as well as the film thickness increase linearly with total polymer concentration in the solvent. Phase separation on two length scales is concluded. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：700 / 706

页数：7

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