Nanosizing of fluorescent objects by spatially modulated illumination microscopy

被引：36

作者：

Failla, AV

Spoeri, U

Albrecht, B

Kroll, A

Cremer, C

机构：

[1] Heidelberg Univ, Kirchhoff Inst Phys, D-69120 Heidelberg, Germany

[2] Heidelberg Univ, Interdisciplinary Ctr Sci Comp IWR, D-69120 Heidelberg, Germany

来源：

APPLIED OPTICS | 2002年 / 41卷 / 34期

关键词：

D O I：

10.1364/AO.41.007275

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new approach to measuring the sizes of small fluorescent objects by use of spatially modulated illumination (SMI) far-field light microscopy is presented. This method is based on SMI measurements combined with a new SMI virtual microscopy (VIM) data analysis calibration algorithm. Here, experimental SMI measurements of fluorescent objects with known diameter (size) were made. From the SMI data obtained, the size was determined in an independent way by use of the SMI VIM algorithm. The results showed that with SMI microscopy in combination with SMI VIM calibration, subwavelength object size measurements as small as 40 nm are experimentally feasible with high accuracy. (C) 2002 Optical Society of America.

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收藏

页码：7275 / 7283

页数：9

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