Resonant inelastic X-ray scattering study of charge excitations in La2CuO4 -: art. no. 177003

被引：113

作者：

Kim, YJ ^{[1
]}

Hill, JP

Burns, CA

Wakimoto, S

Birgeneau, RJ

Casa, D

Gog, T

Venkataraman, CT

机构：

[1] Brookhaven Natl Lab, Dept Phys, Upton, NY 11973 USA

[2] Western Michigan Univ, Dept Phys, Kalamazoo, MI 49008 USA

[3] MIT, Ctr Mat Sci & Engn, Cambridge, MA 02139 USA

[4] Univ Toronto, Dept Phys, Toronto, ON M5S 1A7, Canada

[5] Argonne Natl Lab, Adv Photon Source, CMC CAT, Argonne, IL 60439 USA

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 89卷 / 17期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1103/PhysRevLett.89.177003

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report a resonant inelastic x-ray scattering study of the dispersion relations of charge-transfer excitations in insulating La2CuO4. These data reveal two peaks, both of which show two-dimensional characteristics. The lowest energy excitation has a gap energy of similar to2.2 eV at the zone enter, and a dispersion of similar to1 eV. The spectral weight of this mode becomes dramatically smaller around (pi, pi). The second peak shows a smaller dispersion (similar to0.5 eV) with a zone-center energy of similar to3.9 eV. We argue that these are both highly dispersive exciton modes damped by the presence of the electron-hole continuum.

引用

页码：177003/1 / 177003/4

页数：4

共 22 条

[1] Resonant inelastic x-ray scattering from valence excitations in insulating copper oxides [J].