Extending the quantitative analytical capabilities of the EDXRF technique for plant-based samples

被引:11
作者
Bamford, SA [1 ]
Jaksic, M
Medunic, Z
Wegrzynek, D
Chinea-Cano, E
Markowicz, A
机构
[1] IAEA, Agcy Labs Seibersdorf, Instrumentat Unit, A-1400 Vienna, Austria
[2] Rudjer Boskovic Inst, Zagreb, Croatia
关键词
D O I
10.1002/xrs.721
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The energy-dispersive x-ray fluorescence (EDXRF) technique has limitations in the quantitative analysis of light elements (low-Z analytes with Z<10), for many reasons. This work, however, circumvents the problem through an a priori determination of low-Z analytes, representative of plant-based samples. The main purpose of this work was to characterize the major elements in the dark matrix of some plant-based samples (including biomonitors) using Rutherford backscattering spectrometry (RBS), and the results provided as a generalized input for EDXRF analysis. The derived stoichiometry and mass ratio for the moss, lichen, and cotton cellulose samples analyzed were found to be similar and Close to C7H10O5, with an average matrix of C = 49.8%, H = 4.0% and 0 = 45.8%. Quantitative analysis of plant-based reference material IAEA-336 (lichen) was subsequently carried out. Use of the a priori determined dark matrix elements (from one-time RBS spectrometry) extended the scope of applicability of the EDXRF quantitative methods used, and improved accuracy in the elemental analysis of plant-based samples. The results obtained were in good agreement with the reference values. Copyright (C) 2004 John Wiley Sons, Ltd.
引用
收藏
页码:277 / 280
页数:4
相关论文
共 10 条
[1]   GENERAL-APPROACH FOR QUANTITATIVE ENERGY DISPERSIVE-X-RAY FLUORESCENCE ANALYSIS BASED ON FUNDAMENTAL PARAMETERS [J].
HE, F ;
VANESPEN, PJ .
ANALYTICAL CHEMISTRY, 1991, 63 (20) :2237-2244
[2]  
HECKEL J, 1995, J TRACE MICROPROBE T, V13, P97
[3]   SOFTWARE FOR FUNDAMENTAL PARAMETER METHOD IN ENERGY-DISPERSIVE X-RAY-FLUORESCENCE ANALYSIS OF INTERMEDIATE THICKNESS SAMPLES [J].
HOLYNSKA, B ;
PTASINSKI, J ;
WEGRZYNEK, D .
APPLIED RADIATION AND ISOTOPES, 1994, 45 (04) :409-414
[4]  
*IAEA, 1996, MAN QUANT XRAY AN SY
[5]  
MAYER M, 1997, 913 IPP MAC PLANCK I
[6]  
McMaster W.H., 1969, UCRL50174 LAWR RAD L
[7]  
Molt K, 1999, X-RAY SPECTROM, V28, P59, DOI 10.1002/(SICI)1097-4539(199901/02)28:1<59::AID-XRS310>3.3.CO
[8]  
2-E
[9]   RAPID DETERMINATION OF MULTI-ELEMENTS IN THIN SPECIMENS BY X-RAY SPECTROMETRY [J].
TOMINAGA, H .
NUCLEAR INSTRUMENTS & METHODS, 1974, 114 (01) :65-69
[10]   THE FUNDAMENTAL PARAMETER METHOD FOR ENERGY-DISPERSIVE X-RAY-FLUORESCENCE ANALYSIS OF INTERMEDIATE THICKNESS SAMPLES WITH THE USE OF MONOCHROMATIC EXCITATION [J].
WEGRZYNEK, D ;
HOLYNSKA, B ;
PILARSKI, T .
X-RAY SPECTROMETRY, 1993, 22 (02) :80-85