Edge effect on the field emission properties from vertically aligned carbon nanotube arrays

被引：36

作者：

Jeong, HJ

Lim, SC

Kim, KS

Lee, YH ^{[1
]}

机构：

[1] Sungkyunkwan Univ, Natl Res Lab Carbon Nanotubes, Inst Basic Sci, Dept Phys, Suwon 440746, South Korea

[2] Sungkyunkwan Univ, Ctr Nanotubes & Nanostructed Composites, Suwon 440746, South Korea

来源：

CARBON | 2004年 / 42卷 / 14期

关键词：

carbon nanotubes; chemical vapor deposition; scanning electron microscopy; field emission;

D O I：

10.1016/j.carbon.2004.07.005

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The edge effect of the field emission properties from patterned carbon nanotube (CNT) arrays was investigated. The multiwalled CNTs were grown using thermal chemical vapor deposition (CVD) method. The field emission measurements were taked using two nanomanipulators installed inside a field emission scanning electron microscope (FESEM). It was observed that both the edge current and field enhancement factor were significantly improved due to the less screening effect compared to those at the center.

引用

收藏

页码：3036 / 3039

页数：4

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