ToF-SIMS molecular characterization and nano-SIMS imaging of submicron domain formation at the surface of PS/PMMA blend and copolymer thin films

被引:17
作者
Kailas, L
Audinot, JN
Migeon, HN
Bertrand, P
机构
[1] Univ Catholique Louvain, Unite Physicochim & Phys Mat, B-1348 Louvain, Belgium
[2] Ctr Rech Publ Gabriel Lippmann, Lab Anal Mat, L-1511 Luxembourg, Luxembourg
关键词
copolymers; blends; thin films; submicron domains; ToF-SIMS; nano-SIMS;
D O I
10.1016/j.apsusc.2004.03.063
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Thin films of polystyrene (PS)/poly(methyl methacrylate) (PMMA) blends and block copolymers were characterized by two different SIMS instruments. ToF-SIMS was used to obtain the molecular composition of the upper most surface while nano-SIMS allowed us to visualize the surface morphology with submicrometer lateral resolution. The blends and copolymers showed different effects on annealing. ToF-SIMS spectra of annealed blends showed a decrease in the concentration of PS and an increase in the concentration of PMMA as compared to the pristine sample. By contrast, the spectra of annealed copolymers showed a decrease in the concentration of PMMA and an increase in the concentration of PS. The result obtained from the nano-SIMS imaging of the blends and copolymers revealed the formation of submicron domains at the surface on annealin. In case of blends, the images showed a strong oxygen signal on the surface suggesting a higher PMMA concentration, while for copolymers, the oxygen signal was quite low. ToF-SIMS spectra combined with nano-SIMS images help to interpret the surface topographical changes that the PS/PMMA blend and copolymer thin films undergo on annealing. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:289 / 295
页数:7
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