Van der Pauw resistivity measurements on thermally evaporated copper phthalocyanine thin films

被引：22

作者：

Hassan, AK ^{[1
]}

Gould, RD ^{[1
]}

Ray, AK ^{[1
]}

机构：

[1] KEELE UNIV,DEPT PHYS,THIN FILM LAB,KEELE ST5 5BG,STAFFS,ENGLAND

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1996年 / 158卷 / 02期

关键词：

D O I：

10.1002/pssa.2211580234

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

收藏

页码：K23 / K25

页数：3

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