Determination of carrier density of ZnO nanowires by electrochemical techniques

被引:255
作者
Mora-Sero, Ivan [1 ]
Fabregat-Santiago, Francisco
Denier, Benjamin
Bisquert, Juan
Tena-Zaera, Ramon
Elias, Jamil
Levy-Clement, Claude
机构
[1] Univ Jaume 1, Dept Ciencias Expt, Castellon de La Plana 12071, Spain
[2] CNRS, Inst Sci Chim Seine Amont, LCMTR, F-94320 Thiais, France
关键词
D O I
10.1063/1.2390667
中图分类号
O59 [应用物理学];
学科分类号
摘要
The carrier density of ZnO nanowires has been determined by means of electrochemical impedance spectroscopy. A model taking into account the geometry of ZnO nanowires has been developed and the differences with the standard flat model, as curved Mott-Schottky plots, are discussed. The as-grown electrodeposited samples present a high donor density of 6.2x10(19) cm(-3), dramatically reduced by two orders of magnitude after an annealing in air at 450 degrees C during 1 h. The results show that the surface of the ZnO nanowires is active; therefore this system appears as a useful structure to support a functionalized nanostructured devices. (c) 2006 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 25 条
  • [1] Modelling the electric potential distribution in the dark in nanoporous semiconductor electrodes
    Bisquert, J
    Garcia-Belmonte, G
    Fabregat-Santiago, F
    [J]. JOURNAL OF SOLID STATE ELECTROCHEMISTRY, 1999, 3 (06) : 337 - 347
  • [2] ZnO nanowires synthesized by vapor trapping CVD method
    Chang, PC
    Fan, ZY
    Wang, DW
    Tseng, WY
    Chiou, WA
    Hong, J
    Lu, JG
    [J]. CHEMISTRY OF MATERIALS, 2004, 16 (24) : 5133 - 5137
  • [3] Mott-Schottky analysis of nanoporous semiconductor electrodes in dielectric state deposited on SnO2(F) conducting substrates
    Fabregat-Santiago, F
    Garcia-Belmonte, G
    Bisquert, J
    Bogdanoff, P
    Zaban, A
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2003, 150 (06) : E293 - E298
  • [4] ZnO nanowire field-effect transistor and oxygen sensing property
    Fan, ZY
    Wang, DW
    Chang, PC
    Tseng, WY
    Lu, JG
    [J]. APPLIED PHYSICS LETTERS, 2004, 85 (24) : 5923 - 5925
  • [5] CHARACTERIZATION OF INTRINSIC AND IMPURITY DEEP LEVELS IN ZNSE AND ZNO CRYSTALS BY NONLINEAR SPECTROSCOPY
    GAVRYUSHIN, V
    RACIUKAITIS, G
    JUODZBALIS, D
    KAZLAUSKAS, A
    KUBERTAVICIUS, V
    [J]. JOURNAL OF CRYSTAL GROWTH, 1994, 138 (1-4) : 924 - 933
  • [6] Electrical transport properties of single ZnO nanorods
    Heo, YW
    Tien, LC
    Norton, DP
    Kang, BS
    Ren, F
    Gila, BP
    Pearton, SJ
    [J]. APPLIED PHYSICS LETTERS, 2004, 85 (11) : 2002 - 2004
  • [7] First-principles study of native point defects in ZnO
    Kohan, AF
    Ceder, G
    Morgan, D
    Van de Walle, CG
    [J]. PHYSICAL REVIEW B, 2000, 61 (22) : 15019 - 15027
  • [8] Thin film semiconductor deposition on free-standing ZnO columns
    Konenkamp, R.
    Boedecker, K.
    Lux-Steiner, M.C.
    Poschenrieder, M.
    Zenia, F.
    Levy-Clement, C.
    Wagner, S.
    [J]. 2000, American Institute of Physics Inc. (77)
  • [9] Ultraviolet electroluminescence from ZnO/polymer heterojunction light-emitting diodes
    Könenkamp, R
    Word, RC
    Godinez, M
    [J]. NANO LETTERS, 2005, 5 (10) : 2005 - 2008
  • [10] Nanowire dye-sensitized solar cells
    Law, M
    Greene, LE
    Johnson, JC
    Saykally, R
    Yang, PD
    [J]. NATURE MATERIALS, 2005, 4 (06) : 455 - 459