Effects of uniaxial stress on Xx-ray diffraction spectra

被引：5

作者：

Gauthier, M ^{[1
]}

机构：

[1] Univ Paris 06, CNRS, UMR 7602, F-75252 Paris 05, France

来源：

HIGH PRESSURE RESEARCH | 2002年 / 22卷 / 3-4期

关键词：

uniaxial stress; X-ray diffraction;

D O I：

10.1080/08957950212446

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Uniaxial stress is a typical drawback of solid pressure transmitting medium, at low temperature, which affects experimental spectra by shifting and broadening the diffraction peaks. Corrections to this effects have been proposed in the past only for the systematic shifts. We presented a simple model based on elasticity theory which rationalizes both peak shifts and broadening observed in X-ray diffraction. Our results are compared to the popular Singh model.

引用

页码：779 / 784

页数：6

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