Direct observation of deformation-induced grain growth during the nanoindentation of ultrafine-grained Al at room temperature

被引:371
作者
Jin, M
Minor, AM
Stach, EA
Morris, JW
机构
[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94701 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA
基金
美国国家科学基金会;
关键词
TEM; nanoindentation; aluminum; ultrafine grained microstructure; grain boundary migration;
D O I
10.1016/j.actamat.2004.07.044
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In situ nanoindentation within a transmission electron microscope is used to investigate the deformation mechanisms in ultrafine-grained Al films. Deformation-induced grain growth resulting from grain boundary migration, grain rotation and grain coalescence is commonly observed as the indentation proceeds. In situ studies of nanograined films suggest that the same mechanisms are operative, though the difficulty of imaging nanosized grains makes the evidence less clear. The results suggest that grain growth and coalescence are important modes of response in the deformation of ultrafine- and nanograined materials. (C) 2004 Published by Elsevier Ltd on behalf of Acta Materialia Inc.
引用
收藏
页码:5381 / 5387
页数:7
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